Scanning Electron Microscopy / Micro-Analysis

Scanning Electron Microscopy and Energy Dispersive Spectrometry SEM/EDS

Our Scanning Electron Microscope and Energy Dispersive X-Ray Spectrometer (SEM/EDS) can examine and analyze samples at magnifications from 5X to 200,000X. Both the microstructure and fracture surface are analyzed.

The fracture surface topography revealed at high magnification indicates:

• type of stress (tensile, shear, torsional)
• mode of fracture (ductile, brittle, fatigue, 
  overload)
• direction of fracture propagation 
• area and mechanism of fracture initiation 
• manufacturing or repair related factors contributing to the failure
• other factors related to cause of failure

MTi has two commercial SEM/EDS systems and is one of very few labs with these systems that is strictly dedicated to metallurgical analysis and corrosion-investigations in the Southeast.

Additional SEM images from forensic or metallographic investigations are found here. 

SEM/EDS Chemical Analysis

Chemical Analysis of microscopic particles or regions within a sample analyzed in the Scanning Electron Microscope. Energy Dispersive Spectrometer (EDS) micro-analysis is performed by measuring the energy and intensity distribution of X-ray signals generated by a focused electron beam on the specimen (EDS). With the attachment of the energy dispersive spectrometer, the elemental composition of materials can be obtained.